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Alain Abran, Günter Büren, Reiner R. Dumke, Juan J. Cuadrado-Gallego, Jürgen Münch (Eds.)
Applied Software Measurement
Proceedings of the joined International Conferences on Software Measurement IWSM/MetriKon/Mensura 2010, 10.-12. November 2010, Vector Consulting Services, Stuttgart, Germany
ISBN 978-3-8322-9618-6, Englisch, Paperback,
678 Seiten,
21 x 14,8 cm, 1014 g, 177 Abbildungen,
49,80 € / 99,60 SFR
November 2010
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