Özgür Tan

Characterization of Micro- and Nanometer Resolved Technical Surfaces with Function-oriented Parameters

Charakterisierung von Mikro- und Nanometer aufgelösten technischen Oberflächen mit funktionsorientierten Kenngrößen

ISBN:

978-3-8440-1879-0

Reihe:

Berichte aus dem Lehrstuhl Qualitätsmanagement und Fertigungsmesstechnik, Friedrich-Alexander-Universität Erlangen-Nürnberg
Herausgeber: Prof. Dr.-Ing. Dr.-Ing. E.h. Dr. h.c. mult. A. Weckenmann
Erlangen-Nürnberg

Band:

Schlagwörter:

Surface metrology; optical metrology; manufacturing metrology; measurement; ISO 25178; Siemens-Star; 3D metrology

Publikationsart:

Dissertation

Sprache:

Englisch

Seiten:

138 Seiten

Gewicht:

204 g

Format:

21 x 14,8 cm

Bindung:

Paperback

Preis:

45,80 € / 57,25 SFr

Erscheinungsdatum:

Mai 2013

Kaufen:

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Zusammenfassung:

The structural properties of technical surfaces become more important in the applications of micro and nanotechnology. The possible relationships between geometrical properties of technical surfaces and their functional behavior are commonly investigated by functional tests. Although functional tests may provide correlations between the measured variable and the functional behavior of products, available information is not always sufficient to understand reasons for the lack of functionality and they are not always enough to control manufacturing processes. New approaches are required to evaluate measurement results in a function-oriented way.

In this thesis, based on the analysis of technical functions and description of surfaces with parameters, the informative value of measurement results is investigated. Moreover, surfaces are characterized with function-oriented parameters to predict the behavior of products. The scientific method is described in a general way but its application is shown in a case study. In order to verify the proposed methodology, the wettability of technical surfaces is investigated and it is characterized with functionoriented parameters.